Tip-sample interaction in tapping-mode scanning force microscopy
Tip-sample interaction in tapping-mode scanning force microscopy is a scholarly work, published in 2000 in ''Physical Review B''. The main subjects of the publication include optics, pyrolytic carbon, amplitude, nanotechnology, graphite, composite material, conductive atomic force microscopy, Kelvin probe force microscope, scanning electron microscope, materials science, atomic force microscopy, Optomechanics, highly oriented pyrolytic graphite, Atomic force acoustic microscopy, magnetic force microscope, non-contact atomic force microscopy, electrostatic force microscope, oscillation, microscopy, tapping, scanning probe microscopy, cantilever, and atomic force microscope. Tip-sample interaction in intermittent contact scanning force microscopy, also called tapping mode, is experimentally studied to determine under which conditions tip-sample contact is established.