Quantitative electrostatic force microscopy on heterogeneous nanoscale samples
Quantitative electrostatic force microscopy on heterogeneous nanoscale samples is a scholarly work by Jaime Colchero, Carmen Munuera, and Carmen Ocal, published in 2005 in ''Applied Physics Letters''. The main subjects of the publication include nanotechnology, molecular electronics, conductive atomic force microscopy, Kelvin probe force microscope, materials science, atomic force microscopy, Optomechanics, chemical physics, Atomic force acoustic microscopy, magnetic force microscope, non-contact atomic force microscopy, spectroscopy, electrostatic force microscope, nanometre, SIGNAL, microscopy, electrostatics, scanning probe microscopy, atomic force microscope, chemistry, nanoscopic scale, and force spectroscopy. On this kind of sample, electrostatic force spectroscopy as well as Kelvin force microscopy clearly demonstrate that local and quantitative electrostatic force microscopy has to be implemented with the frequency as the signal source..