Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection
Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection is a scholarly work, published in 2018 in ''Microelectronics Reliability''. The main subjects of the publication include power, electromagnetic pulse, engineering, semiconductor device, physics, optoelectronics, pulse, failure analysis, Pulsed power, Leakage, pipe coupling, electrostatic discharge, voltage, semiconductor, materials science, and electrical engineering. Electronic systems based on solid state devices have changed to be more complicated and miniaturized as the systems developed.