Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection is a scholarly work, published in 2018 in ''Problems of advanced micro- and nanoelectronic systems development''. The main subjects of the publication include counterfeiting, electronic circuit, failure analysis, identification, computer vision, integrated circuit, hardware security, computer science, and engineering.