Structural and optical characterisation of holeyfibres using scanning probe microscopy
Structural and optical characterisation of holeyfibres using scanning probe microscopy is a scholarly work, published in 2001 in ''Electronics Letters''. The main subjects of the publication include scanning ion-conductance microscopy, silicon photonics, scanning probe microscopy, scanning electron microscope, materials science, fiber-optic sensor, optical fiber, optics, optoelectronics, Vibrational analysis with scanning probe microscopy, optical microscope, scanning confocal electron microscopy, near-field scanning optical microscope, Scanning capacitance microscopy, microscopy, and atomic force microscope. A tapered fibre scanning near-field optical microscopy probe has been used to investigate holey fibre modes at 785 nm.