Normalized differential conductance to study current conduction mechanisms in MOS structures
Normalized differential conductance to study current conduction mechanisms in MOS structures is a scholarly work, published in 2018 in ''Microelectronics Reliability''. The main subjects of the publication include physics, failure analysis, differential, thermal conduction, conductance, atomic layer deposition, nanoelectronics, current, materials science, and electrical engineering. In this paper, the conduction mechanisms in MOS structures are investigated using Normalized Differential Conductance (NDC).