Modified short-run statistical process control for test and measurement process
Modified short-run statistical process control for test and measurement process is a scholarly work, published in 2018 in ''The International Journal of Advanced Manufacturing Technology''. The main subjects of the publication include reliability engineering, data mining, computer science, design of experiments, control limit, statistics, process, guard, statistical process control, control chart, standard deviation, mathematics, sensitivity, algorithm, and engineering. The study presents a modified SPC model that incorporates measurement uncertainty from guard bands into the $$ \overline{\mathrm{Z}} $$ and W charts, thereby addressing the implications of short runs, multi-stations and measurement errors on SPC.