Fourier Reconstruction of Density Profiles of Thin Films Using Anomalous X-Ray Reflectivity
Fourier Reconstruction of Density Profiles of Thin Films Using Anomalous X-Ray Reflectivity is a scholarly work, published in 1993 in ''Europhysics Letters''. The main subjects of the publication include materials science, optics, reflectance, Surface weather analysis, X-ray reflectivity, aquarium substrate, thin film, Fourier transform, and surface roughness. The authors present here one such approach using the method of anomalous reflectivity from the substrate and demonstrate its applicability in the case of an organic thin film.