Determination of Accurate Lattice Parameters Using a Diffractometer
Determination of Accurate Lattice Parameters Using a Diffractometer is a scholarly work, published in 1961 in ''Advances in x-ray analysis : proceedings of the ... annual Conference on Application of X-ray Analysis / edited by William M. Mueller and Marie Fay ; sponsored by University of Denver, Denver Research Institute''. The main subjects of the publication include materials science, diffractometer, computational physics, lattice, crystallography, powder diffraction, thermal expansion, biological system, lattice constant, and crystal structure. AbstractWithout modifying the General Electric XRD-5 diffractometer accurate lattice parameters of cubic structures may be determined quite simply and precisely.