A zircon LA-ICPMS reverse depth profiling analysis method and its geological application
A zircon LA-ICPMS reverse depth profiling analysis method and its geological application is a scholarly work, published in 2024 in ''Journal of Analytical Atomic Spectrometry''. The main subjects of the publication include seismology, zircon, prospecting, geochronology, Inductively coupled plasma mass spectrometry, geochemistry, geology, profiling, and Laser Ablation Inductively Coupled Plasma Mass Spectrometry. A new LA-ICPMS analysis method for zircon U–Pb age and trace element composition and its geological application..