System Reliability Evaluation Under Dynamic Operating Conditions
System Reliability Evaluation Under Dynamic Operating Conditions is a scholarly work, published in 2019 in ''IEEE Transactions on Reliability''. The main subjects of the publication include semiconductor device reliability, reliability engineering, skew normal distribution, stochastic modelling, stochastic process, uncertainty quantification, scale, Poisson distribution, mathematics, component, and computer science. The authors investigate how the stochastic time scale influences the system reliability and the correlations between component lifetimes.