Rough surface interferometry at 106 μm
Rough surface interferometry at 106 μm is a scholarly work, published in 1980 in ''Applied Optics''. The main subjects of the publication include optics, wavelength, surface finish, interference microscopy, surface roughness, interferometry, laser, astronomical interferometer, interference, dimensional metrology, White light interferometry, and materials science. It uses a cw CO(2) laser as a light source operating at a 10.6-microm wavelength.