REAK: Reliability analysis through Error rate-based Adaptive Kriging
REAK: Reliability analysis through Error rate-based Adaptive Kriging is a scholarly work, published in 2019 in ''Reliability Engineering and System Safety''. The main subjects of the publication include semiconductor device reliability, reliability engineering, Monte Carlo method, computer science, design of experiments, importance sampling, graph dimension, uncertainty quantification, statistics, multi-objective optimization, mathematical optimization, failure rate, kriging, mathematics, adaptive sampling, and algorithm. Results indicate that REAK is able to reduce the computational demand by as high as 50% compared to state-of-the-art methods of Adaptive Kriging with Monte Carlo Simulation (AK-MCS) and Improved Sequential Kriging Reliability Analysis (ISKRA).