Partially Filled Substrate Integrated Waveguide-Based Microwave Technique for Broadband Dielectric Characterization
Partially Filled Substrate Integrated Waveguide-Based Microwave Technique for Broadband Dielectric Characterization is a scholarly work, published in 2019 in ''IEEE Transactions on Instrumentation and Measurement''. The main subjects of the publication include optics, optoelectronics, microstrip, relative permittivity, dielectric, aquarium substrate, microwave, reverberation room, waveguide, calibration, microwave engineering, dissipation factor, materials science, -, electronic engineering, Scattering parameters, broadband, permittivity, and Planar. A number of standard planar RF substrates and dielectric specimens are measured using the designed PFSIW structure, and a close agreement between the extracted permittivity of these samples with their reference values shows the applicability of the proposed SIW technique.