PTM-based hybrid error-detection architecture for ARM microprocessors
PTM-based hybrid error-detection architecture for ARM microprocessors is a scholarly work, published in 2018 in ''Microelectronics Reliability''. The main subjects of the publication include computer hardware, reuse, microprocessor, TRACE, lithium-ion battery, architecture, Fault injection, fault tolerance, fault detection and isolation, ARM architecture, embedded system, field-programmable gate array, and computer science. The work presents a hybrid error detection architecture that uses ARM PTM trace interface to observe ARM microprocessor behaviour.