Optimal Sensor Placement Based on System Reliability Criterion Under Epistemic Uncertainty
Optimal Sensor Placement Based on System Reliability Criterion Under Epistemic Uncertainty is a scholarly work, published in 2018 in ''IEEE Access''. The main subjects of the publication include reliability engineering, semiconductor device reliability, event, data mining, sorting, fault tree analysis, risk, computer science, measurement uncertainty, fault, fault detection and isolation, and algorithm. Specifically, it develops a dynamic fault tree (DFT) model to describe the dynamic failure behaviors based on failure mode and effects analysis and uses the interval numbers to express the failure rates of components.