Multi-beam X-ray ptychography for high-throughput coherent diffraction imaging
Multi-beam X-ray ptychography for high-throughput coherent diffraction imaging is a scholarly work, published in 2020 in ''Scientific Reports''. The main subjects of the publication include Phase retrieval, computer science, throughput, ptychography, optics, radiography, diffraction, beam, and Coherent diffraction imaging. The authors propose X-ray ptychography using multiple illuminations instead of single illumination in conventional ptychography.