Hierarchical Bayesian Reliability Analysis of Binomial Distribution based on Zero-Failure Data
Hierarchical Bayesian Reliability Analysis of Binomial Distribution based on Zero-Failure Data is a scholarly work, published in 2018. The main subjects of the publication include reliability engineering, semiconductor device reliability, zero, econometrics, data mining, binomial distribution, risk, Bayesian inference, statistics, beta-binomial distribution, negative binomial distribution, mathematics, Bayesian hierarchical modeling, computer science, and Bayesian probability.