Evolutionary Algorithms of Test Generation for Crosstalk Faults of Digital Circuits
Evolutionary Algorithms of Test Generation for Crosstalk Faults of Digital Circuits is a scholarly work, published in 2018 in ''Problems of advanced micro- and nanoelectronic systems development''. The main subjects of the publication include Automatic test pattern generation, electronic circuit, failure analysis, computer science, algorithm, crosstalk, field-programmable gate array, and digital electronics.