Dynamut: A Mutation Testing Tool for Industry-Level Embedded System Applications
Dynamut: A Mutation Testing Tool for Industry-Level Embedded System Applications is a scholarly work, published in 2018 in ''International Journal of Embedded Systems and Applications''. The main subjects of the publication include mutation, reliability engineering, mutation testing, software engineering, test automation, and computer science. The authors then demonstrate how the tool can be used to automate the collection of data using an existing proprietary embedded test suite in a runtime testing environment.