Design Issues for NEM-Relay-Based SRAM Devices
Design Issues for NEM-Relay-Based SRAM Devices is a scholarly work, published in 2018 in ''MATEC Web of Conferences''. The main subjects of the publication include relay, power, transistor, semiconductor device reliability, margin, noise, static random-access memory, electronic engineering, atomic force microscopy, atomic layer deposition, noise margin, nanoelectronics, CMOS, computer science, and electrical engineering. The authors found that the use of relays involve a new challenge in the design of SRAM hybrid devices as the readability and writeability of the resulting cells manifests a strong dependence with the value of the contact resistance of the NEM relay, a parameter that can experience important variations with the continued operation of the device..