Correlation microscope
Correlation microscope is a scholarly work, published in 1990 in ''Optics Letters''. The main subjects of the publication include beam splitter, optics, anti-reflective coating, transmission electron microscope, microscopy, interference microscopy, atomic force microscopy, interferometry, optical microscope, interference, 4Pi microscope, materials science, and microscope. The authors have constructed a correlation microscope based on the Mirau interferometer configuration using a thin silicon nitride film beam splitter, and authors have developed a method to extract the amplitude and phase information of the reflected signal from a sample located at the microscope object plane.