Analysis of split‐plot reliability experiments with subsampling
Analysis of split‐plot reliability experiments with subsampling is a scholarly work, published in 2018 in ''Quality and Reliability Engineering International''. The main subjects of the publication include semiconductor device reliability, reliability engineering, Weibull distribution, skew normal distribution, plot, focus, uncertainty quantification, statistics, Restricted randomization, design of experiments, and computer science. The authors outline a nonlinear mixed‐model analysis for a split‐plot reliability experiment with subsampling and right‐censored Weibull distributed lifetime data.