Scanning thermal microscopy
Scanning thermal microscopy is a type of scanning probe microscopy that maps the local temperature and thermal conductivity of an interface. The probe in a scanning thermal microscope is sensitive to local temperatures – providing a nano-scale thermometer. Thermal measurements at the nanometer scale are of both scientific and industrial interest. The technique was invented by Clayton C. Williams and H. Kumar Wickramasinghe in 1986.
Applications
SThM allows thermal measurements at the nano-scale. These measurements can include: temperature, thermal properties of materials, thermal conductivity, heat capacity, glass transition temperature, latent heat, enthalpy, etc. The applications include:- Ultra large-scale integration lithography research and cellular diagnostics in biochemistry.
- Detecting such parameters as phase changes in polymer blends.
- Joule heating
- Measuring material variations in semiconductor devices
- Subsurface imaging
- Near-field photo thermal micro-spectroscopy
- Data storage
- Calorimetry applications
- Hot-spots in integrated circuits
- Low temperature scanning thermal microscopy
- Magnetic spectroscopy in combination with the ferromagnetic resonance realized in the SThM-FMR technique
- Other applications
Technique
Tip-sample heat transfer can include
- Solid-solid conduction. Probe tip to sample. This is the transfer mechanism which yields the thermal scan.
- Liquid-liquid conduction. When scanning in non-zero humidity, a liquid meniscus forms between the tip and sample. Conduction can occur through this liquid drop.
- Gas conduction. Heat can be transferred through the edges of the probe tip to the sample.